I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Towards a KPI-based Ontology for Condition Monitoring of Au..:

, In: 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA),
Pasic, Faruk ; Wohlers, Benedict ; Becker, Matthias - p. 1282-1285 , 2019
Link: https://doi.org/10.1109/ETFA.2019.8869368