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1 Ergebnisse
1
Simulation and Investigation of Electrothermal Effects in H..:
, In:
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Gao, Xujiao
;
Hennigan, Gary
;
Musson, Lawrence
.. - p. 1-4 , 2019
Link:
https://doi.org/10.1109/SISPAD.2019.8870358
RT T1
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
: T1
Simulation and Investigation of Electrothermal Effects in Heterojunction Bipolar Transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-8870358&Exemplar=1&LAN=DE A1 Gao, Xujiao A1 Hennigan, Gary A1 Musson, Lawrence A1 Huang, Andy A1 Negoita, Mihai YR 2019 SN 1946-1577 K1 Integrated circuit modeling K1 Heterojunction bipolar transistors K1 Computational modeling K1 Heating systems K1 Impact ionization K1 Laboratories K1 heterojunction bipolar transistor K1 TCAD K1 self-heating K1 impact ionization K1 mobility reduction K1 hole back injection SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/SISPAD.2019.8870358 DO https://doi.org/10.1109/SISPAD.2019.8870358 SF ELIB - SuUB Bremen
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