I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Impact of BEOL Design on Self-heating and Reliability in Hi..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Choi, Jaehee ; Monga, Udit ; Park, Yonghee... - p. 1-4 , 2019
Link: https://doi.org/10.1109/SISPAD.2019.8870479