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1 Ergebnisse
1
Transient Simulation of Field-Effect Biosensors How to Avoi..:
, In:
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Kim, Kyoung Yeon
;
Park, Byung-Gook
- p. 1-3 , 2019
Link:
https://doi.org/10.1109/SISPAD.2019.8870481
RT T1
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
: T1
Transient Simulation of Field-Effect Biosensors How to Avoid Charge Screening Effect
UL https://suche.suub.uni-bremen.de/peid=ieee-8870481&Exemplar=1&LAN=DE A1 Kim, Kyoung Yeon A1 Park, Byung-Gook YR 2019 SN 1946-1577 K1 Mathematical model K1 Ions K1 Biological system modeling K1 Transient analysis K1 Electrodes K1 Numerical models K1 Molecular biophysics K1 bio-FET K1 charge screening effect K1 transient simulation) SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/SISPAD.2019.8870481 DO https://doi.org/10.1109/SISPAD.2019.8870481 SF ELIB - SuUB Bremen
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