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Transient Simulation of Field-Effect Biosensors How to Avoi..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Kim, Kyoung Yeon ; Park, Byung-Gook - p. 1-3 , 2019
Link: https://doi.org/10.1109/SISPAD.2019.8870481