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TCAD analysis of FinFET temperature-dependent variability f..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Guerrieri, S. Donati ; Bonani, F. ; Ghione, G. - p. 1-4 , 2019
Link: https://doi.org/10.1109/SISPAD.2019.8870492