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Simulation of Statistical NBTI Degradation in 10nm Doped Ch..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Adamu-Lema, F ; Georgiev, V. ; Asenov, A. - p. 1-4 , 2019
Link: https://doi.org/10.1109/SISPAD.2019.8870552