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Maximizing Percolation Effect using Sub-100 nm Nano-Valley ..:

, In: 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS),
Yoo, Jae-Young ; Seo, Min-Ho ; Lee, Jae-Shin... - p. 91-94 , 2019
Link: https://doi.org/10.1109/MEMSYS.2019.8870688