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Evaluation of Near-Field Undesired Radio Waves from Semicon..:
, In:
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE
,
Nagata, Makoto
;
Watanabe, Koh
;
Sugimoto, Yoshifumi
... - p. 866-869 , 2019
Link:
https://doi.org/10.1109/EMCEurope.2019.8871554
RT T1
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE
: T1
Evaluation of Near-Field Undesired Radio Waves from Semiconductor Switching Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-8871554&Exemplar=1&LAN=DE A1 Nagata, Makoto A1 Watanabe, Koh A1 Sugimoto, Yoshifumi A1 Miura, Noriyuki A1 Tanaka, Satoshi A1 Miyazawa, Yasunori A1 Yamaguchi, Masahiro YR 2019 SN 2325-0364 K1 Wireless communication K1 Long Term Evolution K1 Databases K1 Frequency measurement K1 Integrated circuits K1 Electromagnetic compatibility K1 Semiconductor device measurement K1 Semiconductor integrated circuits K1 Undesired radio waves K1 Noise emission K1 Noise coupling K1 Noise database K1 Wireless interference SP 866 OP 869 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope.2019.8871554 DO https://doi.org/10.1109/EMCEurope.2019.8871554 SF ELIB - SuUB Bremen
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