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1 Ergebnisse
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Enabling fast power integrity transient analysis through pa..:
, In:
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE
,
Bradde, T.
;
Toledo, P.
;
De Stefano, M.
... - p. 759-764 , 2019
Link:
https://doi.org/10.1109/EMCEurope.2019.8871828
RT T1 <cTitle>2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE</cTitle>: T1 <Title>Enabling fast power integrity transient analysis through parameterized small-signal macromodels</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8871828&Exemplar=1&LAN=DE A1 Bradde, T. A1 Toledo, P. A1 De Stefano, M. A1 Zanco, A. A1 Grivet-Talocia, S. A1 Crovetti, P. YR 2019 SN 2325-0364 K1 Integrated circuit modeling K1 Solid modeling K1 Electromagnetic compatibility K1 Transient analysis K1 Voltage control K1 Numerical models K1 Regulators SP 759 OP 764 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope.2019.8871828 DO https://doi.org/10.1109/EMCEurope.2019.8871828 SF ELIB - SuUB Bremen
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