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1 Ergebnisse
1
Accurate and Fast Testing Technique of Operational Amplifie..:
, In:
2019 IEEE International Test Conference in Asia (ITC-Asia)
,
Sasaki, Yuto
;
Ichikawa, Tamotsu
;
Kuwana, Anna
... - p. 1-6 , 2019
Link:
https://doi.org/10.1109/ITC-Asia.2019.00014
RT T1
2019 IEEE International Test Conference in Asia (ITC-Asia)
: T1
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion
UL https://suche.suub.uni-bremen.de/peid=ieee-8871995&Exemplar=1&LAN=DE A1 Sasaki, Yuto A1 Ichikawa, Tamotsu A1 Kuwana, Anna A1 Hatayama, Kazumi A1 Kobayashi, Haruo A1 Machida, Kosuke A1 Aoki, Riho A1 Katayama, Shogo A1 Nakatani, Takayuki A1 Wang, Jianlong A1 Sato, Keno A1 Ishida, Takashi A1 Okamoto, Toshiyuki YR 2019 K1 Switches K1 Semiconductor device measurement K1 Temperature measurement K1 Low voltage K1 Switching circuits K1 Testing K1 High Precision Operational Amplifier K1 Offset Voltage K1 DC-AC Conversion K1 Low Level DC Voltage Measurement K1 Thermo electromotive Force K1 Multi-channel Measurement SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITC-Asia.2019.00014 DO https://doi.org/10.1109/ITC-Asia.2019.00014 SF ELIB - SuUB Bremen
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