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On-Chip Test Clock Validation Using A Time-to-Digital Conve..:

, In: 2019 IEEE International Test Conference in Asia (ITC-Asia),
Miyake, Yousuke ; Kajihara, Seiji ; Chen, Poki - p. 157-162 , 2019
Link: https://doi.org/10.1109/ITC-Asia.2019.00040