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1 Ergebnisse
1
Race and Glitch Handling: A Test Perspective:
, In:
2019 IEEE International Test Conference in Asia (ITC-Asia)
,
Tsai, Kun-Han
- p. 85-90 , 2019
Link:
https://doi.org/10.1109/ITC-Asia.2019.00028
RT T1 <cTitle>2019 IEEE International Test Conference in Asia (ITC-Asia)</cTitle>: T1 <Title>Race and Glitch Handling: A Test Perspective</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8872086&Exemplar=1&LAN=DE A1 Tsai, Kun-Han YR 2019 K1 Clocks K1 Timing K1 Test pattern generators K1 Silicon K1 Tools K1 Load modeling K1 Data models K1 Design Rule Check (DRC), Automated Test Pattern Generation (ATPG), Timing Validation, Event-Driven Logic Simulation, Testability, Design-for-Test (DFT), Timing Variation SP 85 OP 90 LK http://dx.doi.org/https://doi.org/10.1109/ITC-Asia.2019.00028 DO https://doi.org/10.1109/ITC-Asia.2019.00028 SF ELIB - SuUB Bremen
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