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1
Electromagnetic Compatibility in Leakage Current of CMOS In..:
, In:
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE
,
Abedi, Zahra
;
Hemmady, Sameer
;
Antonsen, Thomas
.. - p. 765-768 , 2019
Link:
https://doi.org/10.1109/EMCEurope.2019.8872123
RT T1 <cTitle>2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE</cTitle>: T1 <Title>Electromagnetic Compatibility in Leakage Current of CMOS Integrated Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8872123&Exemplar=1&LAN=DE A1 Abedi, Zahra A1 Hemmady, Sameer A1 Antonsen, Thomas A1 Schamiloglu, Edl A1 Zarkesh-Ha, Payman YR 2019 SN 2325-0364 K1 Leakage currents K1 Electromagnetic interference K1 Predictive models K1 Inverters K1 Radio frequency K1 Semiconductor device measurement K1 Current measurement K1 electromagnetic interference K1 leakage current K1 predictive modeling of CMOS inverters K1 VLSI systems SP 765 OP 768 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope.2019.8872123 DO https://doi.org/10.1109/EMCEurope.2019.8872123 SF ELIB - SuUB Bremen
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