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Characterization of Thin Film Materials Using Near Field TH..:

, In: 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
Amirkhan, F. ; Sakata, R. ; Takiguchi, K.... - p. 1-2 , 2019
Link: https://doi.org/10.1109/IRMMW-THz.2019.8874460