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Rebooting Computing: The Challenges for Test and Reliabilit:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Bosio, A. ; Hamdioui, S. ; O'Connor, I.... - p. 8138-8143 , 2019
Link: https://doi.org/10.1109/DFT.2019.8875270