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Evaluation of TMR effectiveness for soft error mitigation i..:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Sanchez, Antonio ; Barrios, Yubal ; Santos, Lucana. - p. 1-4 , 2019
Link: https://doi.org/10.1109/DFT.2019.8875281