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A State Assignment Method to Improve Transition Fault Cover..:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Yoshimura, Masayoshi ; Takeuchi, Yuki ; Yamazaki, Hiroshi. - p. 1-4 , 2019
Link: https://doi.org/10.1109/DFT.2019.8875322