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On-line Testing for Autonomous Systems driven by RISC-V Pro..:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Ruospo, Annachiara ; Cantoro, Riccardo ; Sanchez, Ernesto... - p. 1-6 , 2019
Link: https://doi.org/10.1109/DFT.2019.8875345