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A Low Capture Power Oriented X-filling Method Using Partial..:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Hosokawa, Toshinori ; Yamazaki, Hiroshi ; Misawa, Kenichiro... - p. 1-6 , 2019
Link: https://doi.org/10.1109/DFT.2019.8875434