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1 Ergebnisse
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Analysis of stochastic Schottky barrier variations within p..:
, In:
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)
,
Neumann, K.
;
Kuehnel, L.
;
Langer, F.
... - p. 169-171 , 2019
Link:
https://doi.org/10.1109/IMWS-AMP.2019.8880082
RT T1
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)
: T1
Analysis of stochastic Schottky barrier variations within printed high frequency rectifiers for harmonics generation
UL https://suche.suub.uni-bremen.de/peid=ieee-8880082&Exemplar=1&LAN=DE A1 Neumann, K. A1 Kuehnel, L. A1 Langer, F. A1 Rennings, A. A1 Benson, N. A1 Schmechel, R. A1 Erni, D. YR 2019 K1 Schottky diodes K1 Harmonic analysis K1 Standards K1 Silicon K1 Integrated circuit modeling K1 Stochastic processes K1 RFID tags K1 Flexible printed circuits K1 Semiconductor device modeling K1 Simulation SP 169 OP 171 LK http://dx.doi.org/https://doi.org/10.1109/IMWS-AMP.2019.8880082 DO https://doi.org/10.1109/IMWS-AMP.2019.8880082 SF ELIB - SuUB Bremen
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