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1 Ergebnisse
1
Simple and Low-Cost Measurement Test Setup to Determine the..:
, In:
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)
,
Perez-Wences, C.
;
Loo-Yau, J. R.
;
Moreno, P.
- p. 544-547 , 2019
Link:
https://doi.org/10.1109/MWSCAS.2019.8884891
RT T1
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)
: T1
Simple and Low-Cost Measurement Test Setup to Determine the RF, LO and IF Impedances for Designing GaN FET Resistive Mixer
UL https://suche.suub.uni-bremen.de/peid=ieee-8884891&Exemplar=1&LAN=DE A1 Perez-Wences, C. A1 Loo-Yau, J. R. A1 Moreno, P. YR 2019 SN 1558-3899 K1 Field effect transistors K1 Mixers K1 Radio frequency K1 Gallium nitride K1 Impedance measurement K1 Frequency measurement K1 RF signals K1 Resistive mixer K1 GaN FET K1 impedance measurements SP 544 OP 547 LK http://dx.doi.org/https://doi.org/10.1109/MWSCAS.2019.8884891 DO https://doi.org/10.1109/MWSCAS.2019.8884891 SF ELIB - SuUB Bremen
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