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1 Ergebnisse
1
Single-Ended-to-Differential Sampling Technique for Sigma D..:
, In:
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)
,
Ali, Hussein
;
Caragiulo, Pietro
;
Tamma, Camillo
... - p. 485-488 , 2019
Link:
https://doi.org/10.1109/MWSCAS.2019.8885204
RT T1
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)
: T1
Single-Ended-to-Differential Sampling Technique for Sigma Delta ADCs in X-Ray Detectors
UL https://suche.suub.uni-bremen.de/peid=ieee-8885204&Exemplar=1&LAN=DE A1 Ali, Hussein A1 Caragiulo, Pietro A1 Tamma, Camillo A1 Xu, Xiaobin A1 Markovic, Bojan A1 Abu-Nimeh, Faisal A1 Doering, Dionisio A1 Dragone, Angelo A1 Haller, Gunther YR 2019 SN 1558-3899 K1 Linearity K1 Detectors K1 Power demand K1 Capacitance K1 Gain K1 X-ray detectors K1 Capacitors SP 485 OP 488 LK http://dx.doi.org/https://doi.org/10.1109/MWSCAS.2019.8885204 DO https://doi.org/10.1109/MWSCAS.2019.8885204 SF ELIB - SuUB Bremen
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