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1 Ergebnisse
1
Pulse Broadening in Combinational Circuits with Standard Lo..:
, In:
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)
,
Olowogemo, Semiu A.
;
Robinson, William H.
;
Yiwere, Ahmed
... - p. 215-218 , 2019
Link:
https://doi.org/10.1109/MWSCAS.2019.8885259
RT T1 <cTitle>2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)</cTitle>: T1 <Title>Pulse Broadening in Combinational Circuits with Standard Logic Cell Synthesis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8885259&Exemplar=1&LAN=DE A1 Olowogemo, Semiu A. A1 Robinson, William H. A1 Yiwere, Ahmed A1 Tachie-Menson, Ebenezer A1 Limbrick, Daniel B. A1 Lin, Bor-Tyng YR 2019 SN 1558-3899 K1 Logic gates K1 Transient analysis K1 Benchmark testing K1 Circuit faults K1 Integrated circuit modeling K1 Reliability K1 EPFL benchmark K1 PVT variation K1 vulnerable gates K1 pulse broadening K1 electrical masking K1 SET pulse K1 Synopsys DC K1 HSpice K1 mitigation SP 215 OP 218 LK http://dx.doi.org/https://doi.org/10.1109/MWSCAS.2019.8885259 DO https://doi.org/10.1109/MWSCAS.2019.8885259 SF ELIB - SuUB Bremen
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