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Virtual System for Measurement of Inkjet Printed Resistive ..:

, In: 2019 IEEE 31st International Conference on Microelectronics (MIEL),
Nikolov, G. ; Gieva, E. ; Nikolova, B.. - p. 209-212 , 2019
Link: https://doi.org/10.1109/MIEL.2019.8889597