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Establishment of ESD Generator Model for Transient Suscepti..:
, In:
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC)
,
Lin, Han-Nien
;
Ko, Bo-Ning
;
Lin, Jeffrey Yen-Ting
... - p. 209-212 , 2019
Link:
https://doi.org/10.23919/EMCTokyo.2019.8893786
RT T1
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC)
: T1
Establishment of ESD Generator Model for Transient Susceptibility Analysis from Chip to System Level
UL https://suche.suub.uni-bremen.de/peid=ieee-8893786&Exemplar=1&LAN=DE A1 Lin, Han-Nien A1 Ko, Bo-Ning A1 Lin, Jeffrey Yen-Ting A1 Ho, Tzu-Hao A1 Lin, Min-Shang A1 Su, Chia-Hung YR 2019 K1 Electrostatic discharges K1 Integrated circuit modeling K1 Generators K1 Pins K1 Crosstalk K1 Analytical models K1 ESD K1 CDM K1 HBM K1 ANSYS K1 EMS SP 209 OP 212 LK http://dx.doi.org/https://doi.org/10.23919/EMCTokyo.2019.8893786 DO https://doi.org/10.23919/EMCTokyo.2019.8893786 SF ELIB - SuUB Bremen
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