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1 Ergebnisse
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New Physics of Breakdown in 2D Hexagonal Boron Nitride Diel..:
, In:
2019 8th International Symposium on Next Generation Electronics (ISNE)
,
Pey, Kin Leong
;
Ranjan, Alok
;
Raghavan, Nagarajan
. - p. 1-4 , 2019
Link:
https://doi.org/10.1109/ISNE.2019.8896617
RT T1
2019 8th International Symposium on Next Generation Electronics (ISNE)
: T1
New Physics of Breakdown in 2D Hexagonal Boron Nitride Dielectrics and Its Potential Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-8896617&Exemplar=1&LAN=DE A1 Pey, Kin Leong A1 Ranjan, Alok A1 Raghavan, Nagarajan A1 O'Shea, Sean YR 2019 SN 2378-8607 K1 Dielectrics K1 Electric breakdown K1 Degradation K1 Two dimensional displays K1 Logic gates K1 Hafnium compounds K1 Leakage currents K1 Dielectric breakdown K1 h-BN K1 Layer-by-layer breakdown K1 Pore formation K1 Percolation model K1 SILC K1 TDDB SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ISNE.2019.8896617 DO https://doi.org/10.1109/ISNE.2019.8896617 SF ELIB - SuUB Bremen
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