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1 Ergebnisse
1
Single-event Evaluation of Xilinx 16nm UltraScale+™ High-Ba..:
, In:
2019 IEEE Radiation Effects Data Workshop
,
Chen, Yanran P.
;
Maillard, Pierre
;
Barton, Jeff
... - p. 1-5 , 2019
Link:
https://doi.org/10.1109/REDW.2019.8906561
RT T1
2019 IEEE Radiation Effects Data Workshop
: T1
Single-event Evaluation of Xilinx 16nm UltraScale+™ High-Bandwidth Memory Enabled FPGA
UL https://suche.suub.uni-bremen.de/peid=ieee-8906561&Exemplar=1&LAN=DE A1 Chen, Yanran P. A1 Maillard, Pierre A1 Barton, Jeff A1 Crabill, Eric A1 Kyu, Patrick A1 Schmitz, John A1 Hart, Michael J. A1 Voogel, Martin L. YR 2019 K1 Particle beams K1 Bandwidth K1 Field programmable gate arrays K1 Fabrics K1 Indexes K1 FinFETs K1 Neutrons K1 SEU K1 SEFI K1 HBM K1 FinFET K1 MPSoC K1 UltraScale+ SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/REDW.2019.8906561 DO https://doi.org/10.1109/REDW.2019.8906561 SF ELIB - SuUB Bremen
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