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1 Ergebnisse
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Characterization of the Effects of 250 MeV Proton-Induced T..:
, In:
2019 IEEE Radiation Effects Data Workshop
,
Messenger, Scott
;
Mishler, Codie
;
Hack, James
. - p. 1-5 , 2019
Link:
https://doi.org/10.1109/REDW.2019.8906608
RT T1
2019 IEEE Radiation Effects Data Workshop
: T1
Characterization of the Effects of 250 MeV Proton-Induced Total Ionizing Dose and Displacement Damage on the HCPL-625K Optocoupler
UL https://suche.suub.uni-bremen.de/peid=ieee-8906608&Exemplar=1&LAN=DE A1 Messenger, Scott A1 Mishler, Codie A1 Hack, James A1 Dudek, Paul YR 2019 K1 Protons K1 Current measurement K1 Radiation effects K1 Testing K1 Annealing K1 Silicon K1 Light emitting diodes SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/REDW.2019.8906608 DO https://doi.org/10.1109/REDW.2019.8906608 SF ELIB - SuUB Bremen
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