I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Simulation Model of Oxide-Aperture Strain Quantum Well VCSE:
, In:
2019 IEEE Photonics Conference (IPC)
,
Shih, Hsiang-Yun
;
Kuo, Hao-Chung
;
Lin, Chien-Chung
... - p. 1-2 , 2019
Link:
https://doi.org/10.1109/IPCon.2019.8908386
RT T1
2019 IEEE Photonics Conference (IPC)
: T1
Simulation Model of Oxide-Aperture Strain Quantum Well VCSEL
UL https://suche.suub.uni-bremen.de/peid=ieee-8908386&Exemplar=1&LAN=DE A1 Shih, Hsiang-Yun A1 Kuo, Hao-Chung A1 Lin, Chien-Chung A1 Cho, Yu-Yun A1 Hsu, Shun-Chieh A1 Huang, Yu-Ming A1 Wang, Shou-Wei A1 Huang, Huang-Hsiung A1 Wu, Chao-Hsin A1 Yeh, Yen-Wei A1 Lu, Yun-Ting YR 2019 SN 2575-274X K1 Vertical cavity surface emitting lasers K1 Quantum well devices K1 Current measurement K1 Strain K1 Bandwidth K1 Data models K1 Quantum-well K1 wire and -dot devices K1 Bragg reflector K1 Laser K1 fiber SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/IPCon.2019.8908386 DO https://doi.org/10.1109/IPCon.2019.8908386 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)