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MOM Capacitance Characterization in G-Band using On-wafer 3..:

, In: 2019 14th European Microwave Integrated Circuits Conference (EuMIC),
Saadi, A.A. ; Margalef, M. ; Pilliet, S. Le... - p. 136-139 , 2019
Link: https://doi.org/10.23919/EuMIC.2019.8909558