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1 Ergebnisse
1
Assessment of a Thick-Oxide Transistor from the 22FDX® Plat..:
, In:
2019 IEEE 2nd 5G World Forum (5GWF)
,
Le, Quang Huy
;
Huynh, Dang Khoa
;
Wang, Defu
... - p. 7-10 , 2019
Link:
https://doi.org/10.1109/5GWF.2019.8911632
RT T1
2019 IEEE 2nd 5G World Forum (5GWF)
: T1
Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs
UL https://suche.suub.uni-bremen.de/peid=ieee-8911632&Exemplar=1&LAN=DE A1 Le, Quang Huy A1 Huynh, Dang Khoa A1 Wang, Defu A1 Kampfe, Thomas A1 Zhao, Zhixing A1 Lehmann, Steffen YR 2019 K1 Transistors K1 Power generation K1 Radio frequency K1 Silicon-on-insulator K1 Stress K1 5G mobile communication K1 Gain K1 FDSOI K1 22FDX® K1 sub-6 GHz K1 5G K1 front-end K1 power amplifier K1 envelope tracking K1 reliability SP 7 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/5GWF.2019.8911632 DO https://doi.org/10.1109/5GWF.2019.8911632 SF ELIB - SuUB Bremen
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