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1 Ergebnisse
1
Detecting Method for an Open-Switch Fault of SiC MOSFET and..:
, In:
2019 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Kwon, Bong-Hyun
;
Bae, Kyu-Chul
;
Kim, Seok-Min
. - p. 2928-2932 , 2019
Link:
https://doi.org/10.1109/ECCE.2019.8912987
RT T1 <cTitle>2019 IEEE Energy Conversion Congress and Exposition (ECCE)</cTitle>: T1 <Title>Detecting Method for an Open-Switch Fault of SiC MOSFET and Si IGBT in Hybrid ANPC Inverter System</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8912987&Exemplar=1&LAN=DE A1 Kwon, Bong-Hyun A1 Bae, Kyu-Chul A1 Kim, Seok-Min A1 Lee, Kyo-Beum YR 2019 SN 2329-3748 K1 Circuit faults K1 Inverters K1 Switches K1 Silicon carbide K1 Silicon K1 MOSFET K1 Insulated gate bipolar transistors K1 Fault detection K1 grid-connected inverter K1 hybrid active neutral-point clamped (ANPC) inverter K1 reliability K1 open switch fault SP 2928 OP 2932 LK http://dx.doi.org/https://doi.org/10.1109/ECCE.2019.8912987 DO https://doi.org/10.1109/ECCE.2019.8912987 SF ELIB - SuUB Bremen
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