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1 Ergebnisse
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Simulation of current crowding in inverse diodes of low-vol..:
, In:
2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)
,
Schwabe, Christian
;
Seidel, Peter
;
Lutz, Josef
- p. P.1-P.7 , 2019
Link:
https://doi.org/10.23919/EPE.2019.8915115
RT T1
2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)
: T1
Simulation of current crowding in inverse diodes of low-voltage Si MOSFETs at power cycling
UL https://suche.suub.uni-bremen.de/peid=ieee-8915115&Exemplar=1&LAN=DE A1 Schwabe, Christian A1 Seidel, Peter A1 Lutz, Josef YR 2019 K1 MOSFET K1 Silicon K1 Europe K1 Temperature measurement K1 Proximity effects K1 Temperature K1 Stress K1 Power cycling K1 Simulation K1 Reliability K1 Thermal stress SP P.1 OP P.7 LK http://dx.doi.org/https://doi.org/10.23919/EPE.2019.8915115 DO https://doi.org/10.23919/EPE.2019.8915115 SF ELIB - SuUB Bremen
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