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A Negative-Bias-Temperature-Instability Study on Omega-Gate..:

, In: 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro),
Silva, Vanessa C. P. ; Wirth, Gilson I. ; Martino, Joao A.. - p. 1-4 , 2019
Link: https://doi.org/10.1109/SBMicro.2019.8919276