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Analysis and measurement of the non-linear refractive index..:
, In:
2019 34th Symposium on Microelectronics Technology and Devices (SBMicro)
,
Sierra, Julian H.
;
Carvalho, Daniel O.
;
Samad, Ricardo E.
.. - p. 1-5 , 2019
Link:
https://doi.org/10.1109/SBMicro.2019.8919392
RT T1 <cTitle>2019 34th Symposium on Microelectronics Technology and Devices (SBMicro)</cTitle>: T1 <Title>Analysis and measurement of the non-linear refractive index of SiOx Ny using pedestal waveguides</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8919392&Exemplar=1&LAN=DE A1 Sierra, Julian H. A1 Carvalho, Daniel O. A1 Samad, Ricardo E. A1 Rangel, Ricardo C. A1 Alayo, Marco I. YR 2019 K1 Optical waveguides K1 Nonlinear optics K1 Optical refraction K1 Optical variables control K1 Optical materials K1 Silicon K1 Optical device fabrication K1 optical devices K1 non-linear photonics K1 silicon oxynitride K1 self-phase modulation K1 non-linear refractive index K1 integrated photonics K1 microelectronics SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/SBMicro.2019.8919392 DO https://doi.org/10.1109/SBMicro.2019.8919392 SF ELIB - SuUB Bremen
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