I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Using Software Metrics for Predicting Vulnerable Code-Compo..:
, In:
2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC)
,
Chong, Tai-Yin
;
Anu, Vaibhav
;
Sultana, Kazi Zakia
- p. 98-103 , 2019
Link:
https://doi.org/10.1109/CSE/EUC.2019.00028
RT T1
2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC)
: T1
Using Software Metrics for Predicting Vulnerable Code-Components: A Study on Java and Python Open Source Projects
UL https://suche.suub.uni-bremen.de/peid=ieee-8919513&Exemplar=1&LAN=DE A1 Chong, Tai-Yin A1 Anu, Vaibhav A1 Sultana, Kazi Zakia YR 2019 K1 Software metrics K1 Java K1 Python K1 Security K1 Testing K1 software security, software metrics, vulnerability prediction, software reliability, machine learning SP 98 OP 103 LK http://dx.doi.org/https://doi.org/10.1109/CSE/EUC.2019.00028 DO https://doi.org/10.1109/CSE/EUC.2019.00028 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)