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1 Ergebnisse
1
Immunity Model of the Embedded CAN Controller to Conducted ..:
, In:
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
,
Dongyao, Zhang
;
Changlin, Zhou
;
Daojie, Yu
... - p. 186-188 , 2019
Link:
https://doi.org/10.1109/EMCCompo.2019.8919788
RT T1 <cTitle>2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)</cTitle>: T1 <Title>Immunity Model of the Embedded CAN Controller to Conducted Interferences</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8919788&Exemplar=1&LAN=DE A1 Dongyao, Zhang A1 Changlin, Zhou A1 Daojie, Yu A1 Shuang, Li A1 Kai, He A1 zhilong, Zhang YR 2019 SN 2575-6893 K1 Integrated circuit modeling K1 Immunity testing K1 Radio frequency K1 Transceivers K1 Integrated Circuit Immunity Model-Conducted Immunity(ICIM-CI) K1 Controller area network(CAN) K1 Direct power injection(DPI)) K1 integrated circuit(IC) K1 Conducted immunity SP 186 OP 188 LK http://dx.doi.org/https://doi.org/10.1109/EMCCompo.2019.8919788 DO https://doi.org/10.1109/EMCCompo.2019.8919788 SF ELIB - SuUB Bremen
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