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1 Ergebnisse
1
A Comprehensive Study of a Bidirectional ESD Protection Dev..:
, In:
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
,
Chen, Zhuojun
;
Wu, Zhiqiang
;
Wu, Ming
... - p. 111-113 , 2019
Link:
https://doi.org/10.1109/EMCCompo.2019.8919822
RT T1 <cTitle>2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)</cTitle>: T1 <Title>A Comprehensive Study of a Bidirectional ESD Protection Device Under Harsh Environment</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8919822&Exemplar=1&LAN=DE A1 Chen, Zhuojun A1 Wu, Zhiqiang A1 Wu, Ming A1 Peng, Wei A1 Zeng, Yun A1 Jin, Xiangliang A1 Li, Binhong A1 Li, Bo YR 2019 SN 2575-6893 K1 Electrostatic discharges K1 Integrated circuits K1 Temperature measurement K1 Stress K1 Radiation effects K1 Electromagnetic compatibility K1 Transmission line measurements K1 electrostatic discharge K1 total-ionizing dose K1 temperature K1 silicon controlled rectifier K1 transmission line pulse SP 111 OP 113 LK http://dx.doi.org/https://doi.org/10.1109/EMCCompo.2019.8919822 DO https://doi.org/10.1109/EMCCompo.2019.8919822 SF ELIB - SuUB Bremen
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