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1 Ergebnisse
1
Impact of SOI and SI Technologies on EMC of CAN Controller:
, In:
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
,
Li, X.
;
Wang, M.
;
Wu, J.
... - p. 102-104 , 2019
Link:
https://doi.org/10.1109/EMCCompo.2019.8919922
RT T1
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
: T1
Impact of SOI and SI Technologies on EMC of CAN Controller
UL https://suche.suub.uni-bremen.de/peid=ieee-8919922&Exemplar=1&LAN=DE A1 Li, X. A1 Wang, M. A1 Wu, J. A1 Li, E. A1 Zhang, H. A1 Li, B. A1 Hao, N. A1 Gao, J. YR 2019 SN 2575-6893 K1 Immunity testing K1 Integrated circuits K1 Pins K1 Silicon-on-insulator K1 Conferences K1 Performance evaluation K1 CAN controller K1 EMC K1 SOI technology K1 DPI K1 150 Ω SP 102 OP 104 LK http://dx.doi.org/https://doi.org/10.1109/EMCCompo.2019.8919922 DO https://doi.org/10.1109/EMCCompo.2019.8919922 SF ELIB - SuUB Bremen
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