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1 Ergebnisse
1
The Research of Bulk Current Injection Probe Used for ICs E..:
, In:
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
,
Zhang, Yaoxing
;
Yan, Zhaowen
;
Wang, Jianwei
... - p. 135-137 , 2019
Link:
https://doi.org/10.1109/EMCCompo.2019.8919952
RT T1 <cTitle>2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)</cTitle>: T1 <Title>The Research of Bulk Current Injection Probe Used for ICs Electromagnetic Immunity Measurement</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8919952&Exemplar=1&LAN=DE A1 Zhang, Yaoxing A1 Yan, Zhaowen A1 Wang, Jianwei A1 Liu, Wei A1 Ning, Zhaoming A1 Min, Zheng YR 2019 SN 2575-6893 K1 Probes K1 Windings K1 Current measurement K1 Capacitance K1 Integrated circuit modeling K1 Insertion loss K1 BCI probe K1 coil winding K1 parasitic capacity K1 matching components SP 135 OP 137 LK http://dx.doi.org/https://doi.org/10.1109/EMCCompo.2019.8919952 DO https://doi.org/10.1109/EMCCompo.2019.8919952 SF ELIB - SuUB Bremen
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