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Evaluation of SET under Process Variability on FinFET Multi..:

, In: 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC),
Brendler, Leonardo H. ; Zimpeck, Alexandra L. ; Meinhardt, Cristina. - p. 179-184 , 2019
Link: https://doi.org/10.1109/VLSI-SoC.2019.8920336