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1 Ergebnisse
1
Novel Micro Scanning with Integrated Atomic Force Microscop..:
, In:
2019 IEEE Conference on Control Technology and Applications (CCTA)
,
Chou, Meng-Hao
;
Huang, Ching-Chi
;
Liu, Yi-Lin
.. - p. 870-875 , 2019
Link:
https://doi.org/10.1109/CCTA.2019.8920500
RT T1 <cTitle>2019 IEEE Conference on Control Technology and Applications (CCTA)</cTitle>: T1 <Title>Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8920500&Exemplar=1&LAN=DE A1 Chou, Meng-Hao A1 Huang, Ching-Chi A1 Liu, Yi-Lin A1 Chen, Huang-Chih A1 Fu, Li-Chen YR 2019 K1 Probes K1 Lenses K1 Laser beams K1 Force K1 Atomic force microscopy K1 Measurement by laser beam K1 Atomic force microscope (AFM) K1 confocal laser scanning microscope (CLSM) K1 variable speed scanning K1 adaptive scanning range K1 regions of interest (ROI) SP 870 OP 875 LK http://dx.doi.org/https://doi.org/10.1109/CCTA.2019.8920500 DO https://doi.org/10.1109/CCTA.2019.8920500 SF ELIB - SuUB Bremen
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