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1 Ergebnisse
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Simulation of the Heavy Charged Particle Impacts on Electri..:
, In:
2019 International Conference on Advanced Technologies for Communications (ATC)
,
Ha, Dao Dinh
;
Trung, Tran Tuan
;
Quang, Nguyen Trong
... - p. 189-192 , 2019
Link:
https://doi.org/10.1109/ATC.2019.8924508
RT T1
2019 International Conference on Advanced Technologies for Communications (ATC)
: T1
Simulation of the Heavy Charged Particle Impacts on Electrical Characteristics of N-MOSFET Device Structure
UL https://suche.suub.uni-bremen.de/peid=ieee-8924508&Exemplar=1&LAN=DE A1 Ha, Dao Dinh A1 Trung, Tran Tuan A1 Quang, Nguyen Trong A1 Lovshenko, Ivan A1 Khanko, Veranika A1 Stempitsky, Viktor YR 2019 SN 2162-1039 K1 Temperature dependence K1 Nitrogen K1 Xenon K1 Argon K1 Ionizing radiation K1 Single event upsets K1 MOSFET K1 device simulation K1 ionizing radiation K1 single event upset K1 linear energy transfer SP 189 OP 192 LK http://dx.doi.org/https://doi.org/10.1109/ATC.2019.8924508 DO https://doi.org/10.1109/ATC.2019.8924508 SF ELIB - SuUB Bremen
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