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Comparative Study of 2-DTC techniques for a 3 Level NPC Inv..:

, In: IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society,
Sharma, Toshi ; Bhattacharya, Avik - p. 6096-6101 , 2019
Link: https://doi.org/10.1109/IECON.2019.8926864