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1 Ergebnisse
1
Degradation of the luminance and impedance evolution analys..:
, In:
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
,
Al Haddad, Andrea
;
Canale, Laurent
;
Picot, Antoine
... - p. 4260-4267 , 2019
Link:
https://doi.org/10.1109/IECON.2019.8927330
RT T1 <cTitle>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Degradation of the luminance and impedance evolution analysis of an OLED under thermal and electrical stress</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8927330&Exemplar=1&LAN=DE A1 Al Haddad, Andrea A1 Canale, Laurent A1 Picot, Antoine A1 Zissis, Georges A1 Maussion, Pascal A1 Dupuis, Pascal YR 2019 SN 2577-1647 K1 Organic light emitting diodes K1 Stress K1 Degradation K1 Impedance K1 Aging K1 Current density K1 Temperature measurement K1 Characterization K1 Estimation K1 Luminance decay K1 Organic Light Emitting Diodes K1 Parameters SP 4260 OP 4267 LK http://dx.doi.org/https://doi.org/10.1109/IECON.2019.8927330 DO https://doi.org/10.1109/IECON.2019.8927330 SF ELIB - SuUB Bremen
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