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1 Ergebnisse
1
An MHD Stirrer 2D Velocity Profile Measurement Validation T..:
, In:
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
,
Flores-Fuentes, Wendy
;
Valenzuela-Delgado, Monica
;
Gonzalez-Navarro, Felix F.
... - p. 5584-5589 , 2019
Link:
https://doi.org/10.1109/IECON.2019.8927393
RT T1 <cTitle>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>An MHD Stirrer 2D Velocity Profile Measurement Validation Through a Machine Vision System</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8927393&Exemplar=1&LAN=DE A1 Flores-Fuentes, Wendy A1 Valenzuela-Delgado, Monica A1 Gonzalez-Navarro, Felix F. A1 Caceres-Hernandez, Danilo A1 Sergiyenko, Oleg A1 Rodriguez-Quinonez, Julio C. A1 Rivas-Lopez, Moises A1 Bravo-Zanoguera, Miguel E. A1 Hernandez-Balbuena, Daniel YR 2019 SN 2577-1647 K1 Magnetohydrodynamics K1 Velocity measurement K1 Mathematical model K1 Fluids K1 Two dimensional displays K1 Machine vision K1 Atmospheric measurements K1 data mining K1 filtering K1 magnetohydrodynamics K1 particle image velocimetry K1 measurements K1 machine vision SP 5584 OP 5589 LK http://dx.doi.org/https://doi.org/10.1109/IECON.2019.8927393 DO https://doi.org/10.1109/IECON.2019.8927393 SF ELIB - SuUB Bremen
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