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1 Ergebnisse
1
Bias stress induced threshold voltage shift in buckled thin..:
, In:
TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)
,
Nair, Aswathi R
;
Anand, Venu
;
Sambandan, Sanjiv
- p. 78-81 , 2019
Link:
https://doi.org/10.1109/TENCON.2019.8929275
RT T1
TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)
: T1
Bias stress induced threshold voltage shift in buckled thin film transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-8929275&Exemplar=1&LAN=DE A1 Nair, Aswathi R A1 Anand, Venu A1 Sambandan, Sanjiv YR 2019 SN 2159-3450 K1 Logic gates K1 Thin film transistors K1 Threshold voltage K1 Contact resistance K1 Insulators K1 Metals K1 thin film transistors K1 buckling K1 threshold voltage shift SP 78 OP 81 LK http://dx.doi.org/https://doi.org/10.1109/TENCON.2019.8929275 DO https://doi.org/10.1109/TENCON.2019.8929275 SF ELIB - SuUB Bremen
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