I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Charge Based Compact Modeling of Gate Leakage Mechanism in ..:
, In:
2018 4th IEEE International Conference on Emerging Electronics (ICEE)
,
Debnath, Ankur
;
Turuvekre, Sreenidhi
;
DasGupta, Nandita
. - p. 1-5 , 2018
Link:
https://doi.org/10.1109/ICEE44586.2018.8937997
RT T1
2018 4th IEEE International Conference on Emerging Electronics (ICEE)
: T1
Charge Based Compact Modeling of Gate Leakage Mechanism in AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-8937997&Exemplar=1&LAN=DE A1 Debnath, Ankur A1 Turuvekre, Sreenidhi A1 DasGupta, Nandita A1 DasGupta, Amitava YR 2018 K1 Logic gates K1 HEMTs K1 MODFETs K1 Aluminum gallium nitride K1 Wide band gap semiconductors K1 Leakage currents K1 Electric fields K1 AlGaN/GaN HEMT K1 charge based gate current model K1 comparison of model with temperature K1 parameter extraction SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICEE44586.2018.8937997 DO https://doi.org/10.1109/ICEE44586.2018.8937997 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)