I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Computer Vision Based Pantograph Inspection:

, In: 2019 IEEE International Conference on Power, Intelligent Computing and Systems (ICPICS),
Li, Yao ; Dai, Shenghua - p. 378-384 , 2019
Link: https://doi.org/10.1109/ICPICS47731.2019.8942424