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The Impact of Drift-region Length Reduction of nLDMOS on ES..:

, In: 2019 IEEE Eurasia Conference on IOT, Communication and Engineering (ECICE),
Fan, Sheng-Kai ; Chen, Shen-Li ; Lin, Po-Lin... - p. 199-200 , 2019
Link: https://doi.org/10.1109/ECICE47484.2019.8942649